Practical Applications of Surface-Enhanced Raman Scattering (SERS)
Applications
| 2010 | Thermo Fisher Scientific
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Trace Detection of Acetamiprid on Raisins
Applications
| 2022 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Food & Agriculture
Agilent ICP-MS Journal (February 2018. Issue 71)
Others
| 2018 | Agilent Technologies
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Trace Detection of Thiabendazole on Bananas
Applications
| 2020 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Food & Agriculture
Trace Detection of Melamine in Dairy Products
Applications
| 2020 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Food & Agriculture
BOOK OF ABSTRACTS ESAS-CSSC 2022 (European Symposium on Analytical Spectrometry Czech-Slovak Spectroscopic Conference 2022)
Others
| 2022 | ESAS
Instrumentation
Manufacturer
Industries
Characterization of Organic Compounds in Atmospheric Nanoparticles by Thermal Extraction - Comprehensive Two-Dimensional Gas Chromatography (GC x GC) in Combination with Selective Detection, Mass Spectrometry and Accurate Mass Detection
Applications
| 2007 | GERSTEL
GCxGC, GC/MSD, GC/HRMS, Thermal desorption, GC/SQ
Instrumentation
GCxGC, GC/MSD, GC/HRMS, Thermal desorption, GC/SQ
Manufacturer
Agilent Technologies, Waters, GERSTEL, ZOEX/JSB
Industries
Environmental
Trace detection of mercaptans in fuel
Applications
| 2025 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Energy & Chemicals
Determination of Heroin in Street Drug Samples
Technical notes
| 2021 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Forensics
Measuring Inorganic Impurities in Semiconductor Manufacturing