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    Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

    Applications
    | 2003 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Trace Elemental Analysis of Trichlorosilane by Agilent ICP-MS

    Applications
    | 2021 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Effects of Filter Composition, Spectral Bandwidth, and Pathlength on Stray Light Levels in the Near-Infrared Region

    Technical notes
    | 2022 | Agilent Technologies
    NIR Spectroscopy
    Instrumentation
    NIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries

    Innovations from Agilent - Improve your separations

    Brochures and specifications
    | 2018 | Agilent Technologies
    GC columns, Consumables, LC columns
    Instrumentation
    GC columns, Consumables, LC columns
    Manufacturer
    Agilent Technologies
    Industries

    Agilent 5800 ICP-OES

    Brochures and specifications
    | 2022 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Determination of Magnesium, Calcium and Potassium in Brines by Flame AAS using the SIPS-10 Accessory for Automated Calibration and On-Line Sample Dilution

    Applications
    | 2010 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals

    Agilent 5900 ICP-OES

    Brochures and specifications
    | 2022 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Surface Enhanced Raman Scattering (SERS) – Expanding the Limits of Conventional Raman Analysis

    Technical notes
    | 2018 | Metrohm
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Metrohm
    Industries

    Analysis of 50 nm Silica Nanoparticles in Semiconductor Process Chemicals by spICP-MS/MS

    Applications
    | 2023 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Detection of Toxic Industrial Compounds: A Guide to Analytical Techniques

    Guides
    | 2003 | Agilent Technologies
    GC/MSD, GC/SQ, LC/MS, LC/SQ, ICP/MS
    Instrumentation
    GC/MSD, GC/SQ, LC/MS, LC/SQ, ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Homeland Security
     

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