Library - page 37 | LabRulez ICPMS

Using triple quadrupole ICP-MS to improve the speed, sensitivity, and accuracy of the analysis of toxic and nutritional elements in baby foods

Applications

| 2021 | Thermo Fisher Scientific

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Thermo Fisher Scientific

Industries

Food & Agriculture

Oil and Gas Application Notebook

Guides

| 2019 | Thermo Fisher Scientific

GC, Software, Ion chromatography, IC-MS, ICP-OES

Instrumentation

GC, Software, Ion chromatography, IC-MS, ICP-OES

Manufacturer

Thermo Fisher Scientific

Industries

Energy & Chemicals

Fluorescence-free 785 nm material identification with MIRA XTR DS

Technical notes

| 2021 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Homeland Security

High purity aluminum analysis

Applications

| 2019 | Thermo Fisher Scientific

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Analysis of solar cell silicon

Applications

| 2019 | Thermo Fisher Scientific

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Thermo Scientific SIPRO Simultaneous Profile Gauge

Brochures and specifications

| 2017 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Energy & Chemicals

Improved productivity for the determination of metals in oil samples using the Agilent 5110 Radial View (RV) ICP-OES with Advanced Valve System

Applications

| 2016 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications

| 2001 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Analysis of Electrolyte and Electrode in LIB Degraded by Overcharge and High Temperature

Applications

| 2026 | Shimadzu

GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ

Instrumentation

GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ

Manufacturer

Shimadzu

Industries

Semiconductor Analysis

2060 XRF Process Analyzer

Brochures and specifications

| 2025 | Metrohm

X-ray

Instrumentation

X-ray

Manufacturer

Metrohm

Industries

Other