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Agilent MS40+
Brochures and specifications
| 2011 | Agilent Technologies
GC/MSD, LC/MS, ICP/MS
Instrumentation
GC/MSD, LC/MS, ICP/MS
Manufacturer
Agilent Technologies
Industries
Low reflectance measurements using the ‘VW’ technique
Technical notes
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
WCPS: ADVANCING PEFORMANCE OF AN AXIALLY VIEWED INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETER FOR SAMPLES HIGH SOLIDS BY INNOVATIVE TORCH DESIGN
Posters
| 2011 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Analysis of As, P dopant distribution of NMOS transistor by FESTEM & EDS
Applications
| 2009 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Energy & Chemicals
Quality Control of Grade Specific Materials
Technical notes
| 2009 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
K-Alpha: Energy Scale Linearity and Calibration
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Verifying the Performance of the Fiber Optic Reflectance Probe on the Thermo Scientific Antaris FT-NIR Analyzer
Technical notes
| 2008 | Thermo Fisher Scientific
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Thermo Fisher Scientific
Industries
Other
Hydrogen Determination in Aluminum and Aluminum Alloys
Applications
| 2007 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
Other projects
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike