Experis Ultra High Purity gases

Brochures and specifications
| 2015 | Air Products
Consumables
Instrumentation
Consumables
Manufacturer
Air Products
Industries

Total metals analysis of digested plant tissue using an Agilent 4200 Microwave Plasma-AES

Applications
| 2015 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies, CEM
Industries
Food & Agriculture

Measurement of composite surface contamination using the Agilent 4100 ExoScan FTIR with diffuse reflectance sampling interface

Applications
| 2015 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing

Safety - Dangers of oxygen-deficient atmospheres

Technical notes
| 2014 | Air Products
Consumables
Instrumentation
Consumables
Manufacturer
Air Products
Industries

Pesticide Authentication by Portable FTIR Spectroscopy

Applications
| 2013 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Food & Agriculture

Oxygen in Copper and Copper Alloys (TC600)

Applications
| 2013 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals

Easy and Rapid System Qualification using the iCAP Series Qualification Kit

Technical notes
| 2013 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries

Surface Chemical-State Analysis of Metal Oxide Catalysts

Applications
| 2012 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing

Monitoring fluorescence resonance energy transfer (FRET) between GFP fusions in lysates of the yeast Saccharomyces cerevisiae using the Agilent Cary Eclipse

Applications
| 2011 | Agilent Technologies
Fluorescence spectroscopy
Instrumentation
Fluorescence spectroscopy
Manufacturer
Agilent Technologies
Industries
Clinical Research

WCPS: Ultratrace Analysis of Phosphorus, Boron and Other Impurities in Photovoltaic Silicon and Trichlorosilane by ICP-MS with High Energy Collision Cell

Posters
| 2011 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
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