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Publication Date
A Buyer’s Guide to Elemental Analysis Instrumentation for Unearthing Battery Minerals
Guides
| 2023 | Agilent Technologies
ICP/MS, ICP-OES, AAS, GD/MP/ICP-AES
Instrumentation
ICP/MS, ICP-OES, AAS, GD/MP/ICP-AES
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Agilent Technologies
Industries
Environmental
Analysis of Undiluted Seawater using ICP-MS with Ultra High Matrix Introduction and Discrete Sampling
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| 2022 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
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Agilent Technologies
Industries
Environmental
Thermo Scientific OXSAS
Brochures and specifications
| 2017 | Thermo Fisher Scientific
Optical Emission Spectroscopy (OES), Software
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Optical Emission Spectroscopy (OES), Software
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Thermo Fisher Scientific
Industries
Ion Pump Troubleshooting
Technical notes
| 2023 | Agilent Technologies
GC/MSD, LC/MS, ICP/MS
Instrumentation
GC/MSD, LC/MS, ICP/MS
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Agilent Technologies
Industries
Analysis of DTPA Extracted Soils per Chinese Standard HJ 804-2016
Applications
| 2020 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
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Agilent Technologies
Industries
Environmental
EA-IRMS: Fast and Precise Isotope Analysis of Liquids on a Delta V Isotope Ratio MS with a High Temperature Conversion Elemental Analyzer
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| 2016 | Thermo Fisher Scientific
Elemental Analysis, GC/HRMS, GC/MSD
Instrumentation
Elemental Analysis, GC/HRMS, GC/MSD
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Thermo Fisher Scientific
Industries
Environmental
Through-container analysis with Raman spectroscopy
Applications
| 2025 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
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Metrohm
Industries
Materials Testing
Highly sensitive analysis of distillate products per ASTM Method D8110 using single quadrupole ICP-MS
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| 2024 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
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Thermo Fisher Scientific
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Energy & Chemicals
Thermo Scientific Element 2 & Element XR High Resolution ICP-MS
Brochures and specifications
| 2018 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
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Thermo Fisher Scientific
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Other
Analysis of semiconductor grade mineral acids
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| 2018 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
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Thermo Fisher Scientific
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Semiconductor Analysis
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