Raman Spectroscopy for Quick Quality Analysis of Diamond Membranes

Applications
| 2008 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Materials Testing

Ultra Low Nitrogen and Oxygen in Iron, Steel, Nickel-Base, and Cobalt-Base Alloys

Applications
| 2003 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals

The Modular Compact Rheometer Series MCR Evolution

Brochures and specifications
| 2024 | Anton Paar
Rheometry, RAMAN Spectroscopy
Instrumentation
Rheometry, RAMAN Spectroscopy
Manufacturer
Anton Paar
Industries
Materials Testing

844 Series: Carbon/Sulfur by Combustion

Brochures and specifications
| 2022 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Energy & Chemicals

Measurement of 87Sr/86Sr Isotope Ratios in Rocks by ICP-QQQ in Mass-Shift Mode

Applications
| 2020 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Oxygen and Nitrogen Determination in Refractory Metals and Their Alloys

Applications
| 2020 | LECO
Elemental Analysis, Sample Preparation
Instrumentation
Elemental Analysis, Sample Preparation
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals

Agilent Cary 3500 UV-Vis Spectrophotometer

Brochures and specifications
| 2018 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries

Monitoring fluorescence resonance energy transfer (FRET) between GFP fusions in lysates of the yeast Saccharomyces cerevisiae using the Agilent Cary Eclipse

Applications
| 2011 | Agilent Technologies
Fluorescence spectroscopy
Instrumentation
Fluorescence spectroscopy
Manufacturer
Agilent Technologies
Industries
Clinical Research

Safety - Handling liquefied compressed gas

Technical notes
| 2013 | Air Products
Consumables
Instrumentation
Consumables
Manufacturer
Air Products
Industries

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
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