WCPS: Ultratrace Analysis of Phosphorus, Boron and Other Impurities in Photovoltaic Silicon and Trichlorosilane by ICP-MS with High Energy Collision Cell
Posters
| 2011 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Identification of Narcotics and Cutting Agents in Mixtures with the Agilent FTIR Forensics Analyzer Package
Applications
| 2022 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Forensics
ON THE SEPARATION AND STRENGTHENING OF THE IMAGE BEHIND THE MIRROR (DERACEMIZATION AND CHIRALITY AMPLIFICATION)
Scientific articles
| 2023 | Chemické listy
Instrumentation
Manufacturer
Industries
Microfocus X-Ray Inspection System Xslicer SMX-6010
Brochures and specifications
| 2023 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Ultra trace measurement of potassium and other elements in ultrapure water using the Agilent 8800 ICP-QQQ in cool plasma reaction cell mode