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Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
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| 2014 | Agilent Technologies
FTIR Spectroscopy
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FTIR Spectroscopy
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Agilent Technologies
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Materials Testing, Semiconductor Analysis
Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS
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| 2022 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Semiconductor Analysis
Agilent ICP-MS Journal (April 2019. Issue 76)
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| 2019 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Clinical Research
X-ray Microanalysis Family
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| 2019 | Thermo Fisher Scientific
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Thermo Fisher Scientific
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Mira DS Handheld Identification System
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| 2020 | Metrohm
RAMAN Spectroscopy
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RAMAN Spectroscopy
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Metrohm
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Homeland Security
Mira P Raman - Product manual
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| 2021 | Metrohm
RAMAN Spectroscopy
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RAMAN Spectroscopy
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Metrohm
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Analysis of limestone for flue gas desulfurization in a power plant with ARL QUANT’X EDXRF Spectrometer
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| 2019 | Thermo Fisher Scientific
X-ray
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X-ray
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Thermo Fisher Scientific
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K-Alpha: Adhesion Failure Analysis
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| 2011 | Thermo Fisher Scientific
X-ray
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X-ray
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Thermo Fisher Scientific
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Materials Testing
Analysis of nutrients in milk-based powders by EDXRF
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| 2023 | Thermo Fisher Scientific
X-ray
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X-ray
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Thermo Fisher Scientific
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Food & Agriculture
Agilent MassHunter Productivity App - Quick Start Guide
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| 2018 | Agilent Technologies
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Software
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Agilent Technologies
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