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    Measuring baseline-corrected spectra on a Cary 60 UV-Vis

    Technical notes
    | 2011 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries

    Quantitative Analysis of Antimony (Sb) in Plastics by EDXRF

    Applications
    | 2012 | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Metrohm i-Raman Plus Fiber Optic Raman spectrometer

    Brochures and specifications
    | 2019 | Metrohm
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Metrohm
    Industries

    Metrohm STRam portable Raman spectrometer

    Brochures and specifications
    | 2020 | Metrohm
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Energy & Chemicals , Materials Testing

    Composite thermal damage – correlation of short beam shear data with FTIR spectroscopy

    Applications
    | 2015 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    HPX Series Inert Hotplate

    Brochures and specifications
    | 2019 | Savillex
    Sample Preparation
    Instrumentation
    Sample Preparation
    Manufacturer
    Savillex
    Industries

    Agilent Cary 610/620 FTIR microscopes and imaging systems

    Brochures and specifications
    | 2014 | Agilent Technologies
    FTIR Spectroscopy, Microscopy
    Instrumentation
    FTIR Spectroscopy, Microscopy
    Manufacturer
    Agilent Technologies
    Industries

    Measuring the purity of low volumes of DNA at 4 °C using the Agilent Cary 60 UV-Vis spectrophotometer with fiber optics microprobe

    Applications
    | 2011 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Pharma & Biopharma

    Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

    Applications
    | 2020 | Agilent Technologies
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Instrumentation
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    The Determination of Hazardous Substances According to RoHS and WEEE Directives

    Applications
    | N/A | Shimadzu
    AAS, X-ray
    Instrumentation
    AAS, X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing
     

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