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Low reflectance measurements using the ‘VW’ technique
Technical notes
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
Industries
Cary 4000/5000/6000i UV-Vis spectrophotometer – Site Preparation Checklist
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| 2016 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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Measurement of Diffuse Reflection from Catalyst Powders
Applications
| 2023 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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Materials Testing
FTIR and UV-Vis Technology for Art Conservation
Others
| 2015 | Agilent Technologies
UV–VIS spectrophotometry, FTIR Spectroscopy
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UV–VIS spectrophotometry, FTIR Spectroscopy
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Agilent Technologies
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Materials Testing
Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500
Applications
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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Materials Testing, Semiconductor Analysis
Measuring the Optical Properties of Photovoltaic Cells
Applications
| 2023 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
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NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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Materials Testing
Agilent Cary Universal Measurement Accessory (UMA)
Technical notes
| 2013 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
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NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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Agilent Cary UV-Vis (NIR) Spectrophotometers Models 4000, 5000, 6000i and 7000 - Long Term Shut Down and Start Up Instructions
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| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
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NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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Solid Sample Holder
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| 2021 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
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NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
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| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
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Materials Testing, Semiconductor Analysis
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