Applications - page 3

Introducing the EDXIR-Holder: Sample Holder/Stocker for Contaminant Measurement

Technical notes

| 2017 | Shimadzu

FTIR Spectroscopy, X-ray

Instrumentation

FTIR Spectroscopy, X-ray

Manufacturer

Shimadzu

Industries

Measuring Relative % Reflectance of Small Samples in a Cary 50 Spectrophotometer

Technical notes

| 2007 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

ATR Sampling Accessories for the Agilent Cary 630 FTIR Spectrometer

Technical notes

| 2022 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Introduction to Laser Ablation ICP-MS for the Analysis of Forensic Samples

Technical notes

| 2004 | Agilent Technologies

ICP/MS, Laser ablation

Instrumentation

ICP/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Forensics

From Collection to Analysis: A Practical Guide to Sample Preparation and Processing of Microplastics

Technical notes

| 2024 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Environmental

Comparison of Copper Diallyl Phthalate and Conductotherm 3000 Sample Mounting Media

Technical notes

| 2017 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Agilent Cary 630 FTIR sample interfaces — combining high performance and versatility

Technical notes

| 2011 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Sampling Guidelines for Handheld Raman Measurements; What You Need To Know

Technical notes

| 2019 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples

Technical notes

| 2010 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Real-time Spectral Correction of Complex Samples using FACT Spectral Deconvolution Software

Technical notes

| 2021 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries