Applications - page 3

The Linear Dynamic Range and Limits of Detection of Fluorescein using the Agilent Cary Eclipse Fluorescence Spectrophotometer

Technical notes

| 2014 | Agilent Technologies

Fluorescence spectroscopy

Instrumentation

Fluorescence spectroscopy

Manufacturer

Agilent Technologies

Industries

True simultaneous ICP-OES for unmatched speed and performance

Technical notes

| 2012 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Verifying Raw Materials by Spatially Offset Raman Spectroscopy

Technical notes

| 2018 | Agilent Technologies

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Fluorescent macromolecules and nanoparticles: characterization of molar mass, size and charge

Technical notes

| N/A | Wyatt Technology (Waters)

GPC/SEC

Instrumentation

GPC/SEC

Manufacturer

Waters

Industries

Energy & Chemicals

Agilent 8900 Triple Quadrupole ICP-MS (Technical Overview)

Technical notes

| 2025 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Other

Advantages of a Fourier Transform Infrared Spectrometer

Technical notes

| 2015 | Thermo Fisher Scientific

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Thermo Fisher Scientific

Industries

Other

Effects of Filter Composition, Spectral Bandwidth, and Pathlength on Stray Light Levels in the Near-Infrared Region

Technical notes

| 2022 | Agilent Technologies

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Applications of ICP-MS in Homeland Security

Technical notes

| 2004 | Agilent Technologies

GC, ICP/MS, Speciation analysis

Instrumentation

GC, ICP/MS, Speciation analysis

Manufacturer

Agilent Technologies

Industries

Homeland Security

Measuring optical densities over 10 Abs on the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)

Technical notes

| 2013 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Low reflectance measurements using the ‘VW’ technique

Technical notes

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries