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Determination of Wear Metals in Lubricating Oil on The Liberty Series II ICP-OES With the Axially-Viewed Plasma

Applications
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals

Agilent Cary 630 FTIR Spectrometer

Brochures and specifications
| 2019 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries

Wire and Rod Analysis by Glow Discharge

Technical notes
| 2018 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals

Laser ablation split stream (LASS) between three ICP-MS for zircon petrochronology

Technical notes
| 2017 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals

Mass spectrometry workflows for improved healthcare

Brochures and specifications
| 2017 | Thermo Fisher Scientific
Sample Preparation, LC/HRMS, LC/MS, LC/MS/MS, LC/Orbitrap, ICP/MS, LC/QQQ
Instrumentation
Sample Preparation, LC/HRMS, LC/MS, LC/MS/MS, LC/Orbitrap, ICP/MS, LC/QQQ
Manufacturer
Thermo Fisher Scientific
Industries
Clinical Research

Fast routine analysis of trace and ultra trace elements in zinc alloys by Glow Discharge Mass Spectrometry

Applications
| 2024 | Thermo Fisher Scientific
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing

Ultra-fast ICP-OES determination of trace elements in water, conforming to US EPA 200.7 and using next generation sample introduction technology

Applications
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Environmental

High precision iron isotope ratio measurements

Applications
| 2021 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Environmental

WCPS: Ultratrace Analysis of Phosphorus, Boron and Other Impurities in Photovoltaic Silicon and Trichlorosilane by ICP-MS with High Energy Collision Cell

Posters
| 2011 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Dedicated axial or radial plasma view for superior speed and performance

Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Other projects
GCMS
LCMS
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More information
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike