Applications - page 26

Performance of the VC Ultra Acid Vapor Cleaning System

Technical notes
| 2021 | Savillex
Sample Preparation
Instrumentation
Sample Preparation
Manufacturer
Savillex
Industries

Why Can GDS Analyze Grey Iron and Other As-Cast Materials?

Technical notes
| 2017 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals

Lunatic hooks micro-volume biologics quantification up with compliant features

Technical notes
| 2020 | Unchained Labs
Particle characterization, UV–VIS spectrophotometry
Instrumentation
Particle characterization, UV–VIS spectrophotometry
Manufacturer
Unchained Labs
Industries
Proteomics

Determination of Acid Number (AN) with Titration and NIR Spectroscopy

Technical notes
| 2019 | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Energy & Chemicals

Performance of the PFA Cyclonic Spray Chamber for ICP-MS

Technical notes
| 2014 | Savillex
Consumables, ICP/MS
Instrumentation
Consumables, ICP/MS
Manufacturer
Savillex
Industries

Seamless Method Transfer between the Agilent Cary 8454 UV- Visible Spectrophotometer and the 8453 UV-Visible Spectrophotometer

Technical notes
| 2014 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries

Well to well repeatability using a white 96 well microplate

Technical notes
| 2011 | Agilent Technologies
Fluorescence spectroscopy
Instrumentation
Fluorescence spectroscopy
Manufacturer
Agilent Technologies
Industries

Understanding Calibration for Glow Discharge Atomic Emission Spectrometry (GD-AES)

Technical notes
| 2011 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals

Optimizing Microplastic Characterization by LDIR: Automated versus Manual Workflows

Technical notes
| 2025 | Agilent Technologies
FTIR Spectroscopy, Particle size analysis
Instrumentation
FTIR Spectroscopy, Particle size analysis
Manufacturer
Agilent Technologies
Industries
Materials Testing

The Latest Advances in Axially Viewed Simultaneous ICP-OES for Elemental Analysis

Technical notes
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Other projects
GCMS
LCMS
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