Applications - page 25

Oxygen in Aluminum and Aluminum Alloys (TC600-Series)

Applications

| 2009 | LECO

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Compositional Depth Profiling of Hard Disks with Glow Discharge Atomic Emission Spectrometry (GD-AES)

Applications

| 2016 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing

Ultra Low Nitrogen and Oxygen in Iron, Steel, Nickel-Base, and Cobalt-Base Alloys

Applications

| 2003 | LECO

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Determination of Hydrogen in Aluminum and Aluminum Alloys

Applications

| 2003 | LECO

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Screening for Sensitive Explosives with Agilent Resolve - a Handheld SORS System

Applications

| 2018 | Agilent Technologies

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Agilent Technologies

Industries

Homeland Security

Practical Applications of Surface-Enhanced Raman Scattering (SERS)

Applications

| 2010 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy

Instrumentation

RAMAN Spectroscopy, Microscopy

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Inspection of Defects in an Automotive Inverter Component with X-Ray Inspection System

Applications

| 2023 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Oxygen Determination in Aluminum

Applications

| 2020 | LECO

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Oxygen in Copper and Copper Alloys (TC600)

Applications

| 2013 | LECO

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS

Applications

| 2003 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis