Determination of ultra trace elements in high purity hydrogen peroxide with Agilent 8900 ICP-QQQ

Applications
| 2016 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

High Automation of Thermo Scientific FlashSmart CHN/O Analyzer using the MultiValve Control (MVC) Module

Applications
| 2016 | Thermo Fisher Scientific
Elemental Analysis, Software
Instrumentation
Elemental Analysis, Software
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals

Spectroscopy Solutions for Pharmaceuticals

Technical notes
| 2016 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma

What are the benefits and considerations of upgrading to ICP-OES from AAS?

Technical notes
| 2016 | Thermo Fisher Scientific
ICP-OES, AAS
Instrumentation
ICP-OES, AAS
Manufacturer
Thermo Fisher Scientific
Industries

Single particle analysis of nanomaterials using the Agilent 7900 ICP-MS

Applications
| 2015 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing

Non-Destructive Evaluation of Composite Thermal Damage with Agilent’s New Handheld 4300 FTIR

Applications
| 2014 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing

Determination of metals in soil by microwave plasma - atomic emission spectrometry (MP-AES) using DTPA extraction

Applications
| 2013 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Environmental

Environmentally friendly oil in water analysis by FTIR spectroscopy, based on ASTM D7678-11

Applications
| 2013 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Environmental

Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS

Applications
| 2013 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Dedicated axial or radial plasma view for superior speed and performance

Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Other projects
GCMS
LCMS
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