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Determination of trace elements in ultrapure semiconductor grade sulfuric acid using the Agilent 8900 ICP-QQQ in MS/MS mode
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| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Semiconductor Analysis
DMA 501, DMA 1001 Compact Density Meters
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| 2022 | Anton Paar
Density Meters
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Anton Paar
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Analysis Solutions for Quality Control of Hydrogen
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| 2026 | Shimadzu
GC, GC/MSD, FTIR Spectroscopy, X-ray, TOC
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GC, GC/MSD, FTIR Spectroscopy, X-ray, TOC
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Shimadzu
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Energy & Chemicals
Reverse Engineering of Materials and Polymers Using Infrared and Raman microscopy
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| 2021 | Bruker Optics
FTIR Spectroscopy, RAMAN Spectroscopy
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FTIR Spectroscopy, RAMAN Spectroscopy
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Bruker
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Materials Testing
Ceramic Analysis by EDXRF
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| 2019 | Shimadzu
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Materials Testing
APWC: Interference-free Measurement of Trace Mercury in Tungsten-rich Cosmetic Sample using ICP-QQQ
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| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
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Agilent Technologies
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Agilent 8900 Triple Quadrupole ICP-MS (Technical Overview)
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| 2025 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Highly sensitive analysis of distillate products per ASTM Method D8110 using single quadrupole ICP-MS
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| 2024 | Thermo Fisher Scientific
ICP/MS
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ICP/MS
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Thermo Fisher Scientific
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Energy & Chemicals
Reduce Costs and Boost Productivity with the Advanced Valve System (AVS) 6 or 7 Port Switching Valve System
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| 2024 | Agilent Technologies
ICP-OES
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ICP-OES
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Agilent Technologies
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Validation of quantitative method for determination of elemental impurities in pharmaceutical products following USP 232/233 on ICPMS-2030
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| 2019 | Shimadzu
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Shimadzu
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