WCPS: Trace Level Analysis of V, As and Se Using He Cell Gas via Kinetic Energy Discrimination and Collisional Dissociation in Acidic Matrices
Posters
| 2010 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Determination of V, Ni, and Fe in Crude Oils and Bitumen using Sequential ICP-OES and Scandium as an Internal Standard
Applications
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)
Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Highly sensitive analysis of distillate products per ASTM Method D8110 using single quadrupole ICP-MS
Posters
| 2024 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals
Determination of Major and Trace Elements in the Tea Leaves by ICP-AES