X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)
Applications
| N/A | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films
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