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    Lowering the Cost of Fluoropolymer Components in Semiconductor Manufacturing

    Technical notes
    | 2021 | Savillex
    Consumables
    Instrumentation
    Consumables
    Manufacturer
    Savillex
    Industries
    Semiconductor Analysis

    Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS

    Applications
    | 2023 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Determination of Organic Contaminants in Sulfuric Acid using Wet Oxidation Type Total Organic Carbon Analyzer

    Applications
    | 2018 | Shimadzu
    TOC
    Instrumentation
    TOC
    Manufacturer
    Shimadzu
    Industries
    Energy & Chemicals

    Measuring Inorganic Impurities in Semiconductor Manufacturing

    Guides
    | 2022 | Agilent Technologies
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Instrumentation
    GC, ICP/MS, Speciation analysis, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Agilent ICP-MS Journal (October 2020, Issue 82)

    Others
    | 2020 | Agilent Technologies
    HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
    Instrumentation
    HPLC, ICP/MS, Speciation analysis, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental, Food & Agriculture, Energy & Chemicals , Semiconductor Analysis

    Agilent ICP-MS Journal (April 2020, Issue 80)

    Others
    | 2020 | Agilent Technologies
    Software, ICP/MS, ICP/MS/MS
    Instrumentation
    Software, ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Ultra trace measurement of potassium and other elements in ultrapure water using the Agilent 8800 ICP-QQQ in cool plasma reaction cell mode

    Applications
    | 2014 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Technical Overview and Performance Capability of the Agilent 7900s ICP-MS for Semiconductor Applications

    Technical notes
    | 2020 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Agilent ICP-MS Journal (November 2019. Issue 78)

    Others
    | 2019 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental, Semiconductor Analysis

    Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS

    Applications
    | 2017 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis
     

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