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    REACTION CELL FRONTIER: REMOVING OXIDE POLYATOMIC ION INTERFERENCES USING AN INNOVATIVE REACTION CELL ICP-MS

    Posters
    | N/A | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries

    APWC: Interference-free Measurement of Trace Mercury in Tungsten-rich Cosmetic Sample using ICP-QQQ

    Posters
    | 2017 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Others

    Analysis of Platinum Group Elements (PGEs) in road dust using the Agilent 8900 Triple Quadrupole ICP-MS in MS/MS mode

    Posters
    | N/A | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental

    Analysis of Blood Serum on the Liberty Series II ICP OES with the Axially- Viewed Plasma

    Applications
    | 2015 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries
    Clinical Research

    A novel ICP-MS/MS approach for the analysis of vanadium in glucose magnesium sulfate injection to meet the requirement of USP<232>/<233>

    Posters
    | 2019 | Agilent Technologies (ASMS)
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Pharma & Biopharma

    The determination of thin film thickness using reflectance spectroscopy

    Applications
    | 2011 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Al Analysis by Atomic Absorption

    Applications
    | N/A | Shimadzu
    AAS
    Instrumentation
    AAS
    Manufacturer
    Shimadzu
    Industries

    Unmatched Removal of Spectral Interferences in ICP-MS Using the Agilent Octopole Reaction System with Helium Collision Mode

    Technical notes
    | 2006 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries

    FACT spectral deconvolution

    Technical notes
    | 2012 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Real-time Spectral Correction of Complex Samples using FACT Spectral Deconvolution Software

    Technical notes
    | 2021 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries
     

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