Removal of hydride ion interferences (MH+ ) on Rare Earth Elements using the Agilent 8800 Triple Quadrupole ICP-MS
Applications
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Analysis of trace metallic impurities in hydrocarbon fuels by ICP-MS
Applications
| 2013 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
X-ray photoelectron spectrometer - AXIS Nova
Brochures and specifications
| 2018 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Others
Direct measurement of trace rare earth elements (REEs) in high-purity REE oxide using the Agilent 8800 Triple Quadrupole ICP-MS with MS/MS mode
Applications
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing
WCPS: Investigation of Microplastic Size and Number Changes During Simulated UV-Degradation Using Single Particle ICP-MS/MS
Posters
| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Materials Testing
APWC: Investigation of ICP-MS/MS using oxygen or hydrogen as a reaction gas for interference-free analysis of phosphorus in organic solvents
Posters
| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Absolute Reflectance Measurement of Anti-Reflective Film for Solar Cells Using the SolidSpec-3700
Applications
| N/A | Shimadzu
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Materials Testing
Agilent ICP-MS Journal (August 2021, Issue 85)
Others
| 2021 | Agilent Technologies
Consumables, ICP/MS, ICP/MS/MS
Instrumentation
Consumables, ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Food & Agriculture
Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS
Technical notes
| 1995 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Single Quadrupole ICP-MS vs Triple Quadrupole ICP-MS