Optimizing GFAAS Ashing and Atomizing Temperatures using Surface Response Methodology
Technical notes
| 2018 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
What are the benefits and considerations of upgrading to ICP-OES from AAS?
Technical notes
| 2016 | Thermo Fisher Scientific
ICP-OES, AAS
Instrumentation
ICP-OES, AAS
Manufacturer
Thermo Fisher Scientific
Industries
Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS
Technical notes
| 1995 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Instrument Zero and Blank Reading on the SpectrAA Instruments
Technical notes
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Guidelines for Using Non-Aqueous Solvents in Atomic Absorption Spectrometry
Technical notes
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
A Comparison of the Relative Cost and Productivity of Traditional Metals Analysis Techniques Versus ICP-MS in High Throughput Commercial Laboratories
Technical notes
| 2005 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
UltrAA lamps — Increase sensitivity by up to 40%
Technical notes
| 2013 | Agilent Technologies
Consumables, AAS
Instrumentation
Consumables, AAS
Manufacturer
Agilent Technologies
Industries
Reproducibility of the Shimadzu DTG-60
Technical notes
| N/A | Shimadzu
Thermal Analysis
Instrumentation
Thermal Analysis
Manufacturer
Shimadzu
Industries
Materials Testing
AA Troubleshooting and Maintenance Guide
Technical notes
| N/A | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Direct swab method procedure using TOC-V and SSM-5000A