Applications - page 2

Failure analysis of packaging materials

Applications

| 2021 | Bruker Optics

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Bruker

Industries

Materials Testing

Analysis of solar cell silicon

Applications

| 2019 | Thermo Fisher Scientific

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

ICP-OES Analysis of Electrolytes for All-Vanadium Redox Flow Batteries

Applications

| 2024 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

Porosity Analysis of Cast Aluminum Using the LECO IA44

Applications

| 2013 | LECO

Microscopy, Software

Instrumentation

Microscopy, Software

Manufacturer

LECO

Industries

Energy & Chemicals , Materials Testing

Rapid XPS image acquisition using SnapMap

Applications

| 2018 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

ICP-MS Analysis of Trace Elements in LIB Cathode Materials

Applications

| 2022 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

Spectrophotometric Spatial Profiling of Coated Optical Wafers

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Investigating the Angular Dependence of Absolute Specular Reflection

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Quality Control and Failure Analysis of Rubber Samples

Applications

| 2021 | Bruker Optics

FTIR Spectroscopy, Microscopy

Instrumentation

FTIR Spectroscopy, Microscopy

Manufacturer

Bruker

Industries

Materials Testing

Method for Charge Compensation on Sigma Probe, Theta Probe and Theta 300

Applications

| 2008 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing