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A Faster, More Accurate Way of Characterizing Cube Beamsplitters
Applications
| 2022 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Optical Characterization of Thin Films
Applications
| 2022 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Eaton UPS Services (Electronic format)
Brochures and specifications
| 2022 | Eaton
Laboratory equipment
Instrumentation
Laboratory equipment
Manufacturer
Eaton
Industries
Fluorescence-free 785 nm material identification with MIRA XTR DS
Technical notes
| 2021 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Homeland Security
Micro-Raman Spectroscopy in Thin Section Analysis of Rock Mineralogy
Applications
| 2019 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Materials Testing
Measuring the cover and shade protection factors of synthetic shadecloth
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Low reflectance measurements using the ‘VW’ technique
Technical notes
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
SENTERRA II Compact Raman Microscop
Brochures and specifications
| 2021 | Bruker Optics
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Bruker
Industries
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike