Quantitative Analysis of Elements in Small Quantity of Organic Matter by EDXRF - New Feature of Background FP Method
Applications
| 2013 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Energy & Chemicals
Cytosolic expression of Green Fluorescent Protein (GFP) and its derivatives in the yeast Saccharomyces cerevisiae: Detection in vivo using the Agilent Cary Eclipse
Applications
| 2011 | Agilent Technologies
Fluorescence spectroscopy
Instrumentation
Fluorescence spectroscopy
Manufacturer
Agilent Technologies
Industries
Clinical Research
Monitoring fluorescence resonance energy transfer (FRET) between GFP fusions in lysates of the yeast Saccharomyces cerevisiae using the Agilent Cary Eclipse
Applications
| 2011 | Agilent Technologies
Fluorescence spectroscopy
Instrumentation
Fluorescence spectroscopy
Manufacturer
Agilent Technologies
Industries
Clinical Research
Method for Charge Compensation on Sigma Probe, Theta Probe and Theta 300
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
K-Alpha: Accurate Feature Alignment with Unique Reflex Optics
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Confocal Raman Microscopy Applications in the Polymer Industry
Applications
| 2008 | Thermo Fisher Scientific
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Measurement of Samples by Transmission Spectroscopy with the Thermo Scientific Antaris FT-NIR Analyzer
Applications
| 2008 | Thermo Fisher Scientific
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Thermo Fisher Scientific
Industries
Other
Pretreatment Methods for Eliminating the Interference Fringes
Applications
| N/A | Shimadzu
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Shimadzu
Industries
Quantitative Depth Profile (QDP) Analysis of NIST 2135c - Ni/Cr Thin Film Depth Profile Standard