WCPS: ADVANCING PEFORMANCE OF AN AXIALLY VIEWED INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETER FOR SAMPLES HIGH SOLIDS BY INNOVATIVE TORCH DESIGN
Posters
| 2011 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Optimum parameters for UV-VIS-NIR spectroscopy
Posters
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
WCPS: Trace Level Analysis of V, As and Se Using He Cell Gas via Kinetic Energy Discrimination and Collisional Dissociation in Acidic Matrices
Posters
| 2010 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
WCPS: Performance evaluation of Helium Mode ICP-MS for high-matrix sample types in a high-throughput European laboratory
Posters
| 2010 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies, CEM
Industries
Environmental
ICP-MS : The Ultimate GC Detector
Posters
| 2010 | Agilent Technologies
GC, ICP/MS, Speciation analysis
Instrumentation
GC, ICP/MS, Speciation analysis
Manufacturer
Agilent Technologies
Industries
Agilent Periodic Table Poster
Posters
| 2010 | Agilent Technologies
ICP/MS, ICP-OES, AAS
Instrumentation
ICP/MS, ICP-OES, AAS
Manufacturer
Agilent Technologies
Industries
IMSC: A New Design of Ion Lens and Collision/Reaction Cell for ICP-MS
Posters
| 2009 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Analysis of Environmental Samples Following US EPA Guidelines Utilizing a New Simultaneous CCD Detector ICP-OES System
Posters
| 2006 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Environmental
WCPS: Application of Collision/Reaction Cell ICP-MS to the Analysis of Variable and Unknown Samples
Posters
| 2004 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Food & Agriculture
10 Reasons Steel Industry Uses the ARL iSpark Pluswith Spark-DATInclusion Analysis