Determination of ultratrace elements in semiconductor grade TMAH developer

Applications
| 2018 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing

Superior ICP-OES optical design for unmatched speed and performance

Technical notes
| 2016 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries

Routine determination of trace rare earth elements in high purity Nd2 O3 using the Agilent 8800 ICP-QQQ

Applications
| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental

The Linear Dynamic Range and Limits of Detection of Fluorescein using the Agilent Cary Eclipse Fluorescence Spectrophotometer

Technical notes
| 2014 | Agilent Technologies
Fluorescence spectroscopy
Instrumentation
Fluorescence spectroscopy
Manufacturer
Agilent Technologies
Industries

Superior ICP-OES optical design for unmatched speed and performance

Technical notes
| 2014 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries

True simultaneous ICP-OES for unmatched speed and performance

Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries

Analysis of wear metals and contaminants in engine oils using the 4100 MP-AES

Applications
| 2011 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals

WCPS: Ultra High Throughput Analysis of Mineral Digests Using a Novel, Multi-Loop Sample Introduction System with ICP-MS (PC 094)

Posters
| 2011 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Agilent MS40+

Brochures and specifications
| 2011 | Agilent Technologies
GC/MSD, LC/MS, ICP/MS
Instrumentation
GC/MSD, LC/MS, ICP/MS
Manufacturer
Agilent Technologies
Industries

Low reflectance measurements using the ‘VW’ technique

Technical notes
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Other projects
GCMS
LCMS
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