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Sensitive Detection of 2-MIB and Geosmin in Drinking Water
Applications
| 2012 | Agilent Technologies
GC/MSD, GC/MS/MS, GC/QQQ
Instrumentation
GC/MSD, GC/MS/MS, GC/QQQ
Manufacturer
Agilent Technologies
Industries
Environmental
Organophosphorus Pesticides Analysis Using an Agilent J&W DB-5ms Ultra Inert Capillary GC Column
Applications
| 2010 | Agilent Technologies
GC/MSD, GC/SQ, GC columns, Consumables
Instrumentation
GC/MSD, GC/SQ, GC columns, Consumables
Manufacturer
Agilent Technologies
Industries
Environmental
Semivolatile Organics Analysis Using an Agilent J&W HP-5ms Ultra Inert Capillary GC Column
Applications
| 2009 | Agilent Technologies
GC/MSD, GC/SQ, GC columns, Consumables
Instrumentation
GC/MSD, GC/SQ, GC columns, Consumables
Manufacturer
Agilent Technologies
Industries
Environmental
Analysis of Phytoestrogens in Soy Milk by GC/MS/MS with the Agilent 7000 Series Triple Quadrupole GC/MS
Applications
| 2009 | Agilent Technologies
GC/MSD, GC/MS/MS, GC/QQQ
Instrumentation
GC/MSD, GC/MS/MS, GC/QQQ
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Determination of Fatty Acid Methyl Esters by GCxGC-TOFMS
Applications
| 2008 | LECO
GCxGC, GC/MSD, GC/TOF
Instrumentation
GCxGC, GC/MSD, GC/TOF
Manufacturer
Agilent Technologies, LECO
Industries
Food & Agriculture
Identifying Pesticides with Full Scan, SIM, μECD, and FPD from a Single Injection
Applications
| 2005 | Agilent Technologies
GC, GC/MSD, GC/SQ
Instrumentation
GC, GC/MSD, GC/SQ
Manufacturer
Agilent Technologies
Industries
Environmental, Food & Agriculture
Ensure Compliance for Software Upgrades
Brochures and specifications
| 2024 | Agilent Technologies
Software
Instrumentation
Software
Manufacturer
Agilent Technologies
Industries
Agilent 6890 GC - Polyarc Configuration Tool
Manuals
| 2022 | ARC
GC
Instrumentation
GC
Manufacturer
Agilent Technologies, ARC
Industries
Agilent 8355 Sulfur Chemiluminescence Detector
Brochures and specifications
| 2015 | Agilent Technologies
GC
Instrumentation
GC
Manufacturer
Agilent Technologies
Industries
The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
Applications
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis
Other projects
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike