ICPMS
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Applications - page 16

Update to the UV-Visible ChemStation method for testing photometric accuracy in the ultraviolet region of the spectrum

Technical notes
| 2013 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries

Simplifying quality control using Near-Infrared Spectroscopy

Technical notes
| 2018 | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries

CO2 Transmission Into Bulk Drug Substance Containers

Technical notes
| 2021 | Savillex
Consumables
Instrumentation
Consumables
Manufacturer
Savillex
Industries
Pharma & Biopharma

Fluorescence-free 785 nm material identification with MIRA XTR DS

Technical notes
| 2021 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Homeland Security

Support for Title 21 CFR Part 11 and Annex 11 Compliance: Agilent OpenLab Server and OpenLab ECM XT

Technical notes
| 2024 | Agilent Technologies
Software
Instrumentation
Software
Manufacturer
Agilent Technologies
Industries
Other

Quantitative Depth Profile (QDP) Analysis of Plated Samples

Technical notes
| 2006 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals

A look under the hood of Lunatic

Technical notes
| 2020 | Unchained Labs
Particle characterization, UV–VIS spectrophotometry
Instrumentation
Particle characterization, UV–VIS spectrophotometry
Manufacturer
Unchained Labs
Industries
Proteomics

Automating data processing and analysis with Mnova Gears

Technical notes
| 2021 | SciY/Mestrelab Research
Software
Instrumentation
Software
Manufacturer
SciY/Mestrelab Research
Industries
Other

Surface Enhanced Raman Scattering (SERS) – Expanding the Limits of Conventional Raman Analysis

Technical notes
| 2018 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries

Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples

Technical notes
| 2010 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike