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Carbon and Oxygen Quantification in Silicon wafers
Applications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Semiconductor Analysis
Identification of Copper Concentrates Using EDX and XRD
Applications
| 2021 | Shimadzu
X-ray, XRD
Instrumentation
X-ray, XRD
Manufacturer
Shimadzu
Industries
Materials Testing
Using ICP-MS/MS with M-Lens for the analysis of high silicon matrix samples
Posters
| 2020 | Agilent Technologies (ASMS)
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Determination of Elemental Impurities in Graphite-based Anodes using the Agilent 5110 ICP-OES
Applications
| 2019 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Materials Testing
Oxygen and Nitrogen in Solid Iron, Steel, Nickel-Base, and Cobalt-Base Alloys
Applications
| 2019 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
Analysis of ethanol fuel according to standard methods using the Agilent 5100 SVDV ICP-OES
Applications
| 2015 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
WCPS: Analysis Of Fuel Samples By Microwave Plasma - Atomic Emission Spectrometry
Posters
| 2012 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Handheld FTIR spectroscopy applications using the Agilent ExoScan 4100 FTIR with diffuse sample interface
Applications
| 2011 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike