Methods for the Forensic Analysis of Adhesive Tape Samples by LA-ICP- MS
Applications
| 2004 | Agilent Technologies
ICP/MS, Laser ablation
Instrumentation
ICP/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Forensics
Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ
Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Routine determination of trace rare earth elements in high purity Nd2 O3 using the Agilent 8800 ICP-QQQ
Applications
| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Analysis of Shellfish Tissue for Cadmium, Mercury and Nickel
Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Validation of quantitative method for determination of elemental impurities in pharmaceutical products following USP 232/233 on ICPMS-2030
Applications
| 2019 | Shimadzu
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Shimadzu
Industries
Pharma & Biopharma
Analysis of Plants – 2
Applications
| N/A | Shimadzu
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Shimadzu
Industries
Food & Agriculture
Analysis of Heavy Metals in Baby FoodUsing ICP-MS
Applications
| 2025 | Shimadzu
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Shimadzu
Industries
Food & Agriculture
Particle Size Analysis of Polystyrene Microplastics by Single Particle (sp) ICP-MS
Applications
| 2022 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Determination of metals in soil by microwave plasma - atomic emission spectrometry (MP-AES) using DTPA extraction
Applications
| 2013 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Environmental
X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)