Applications - page 15

Methods for the Forensic Analysis of Adhesive Tape Samples by LA-ICP- MS

Applications
| 2004 | Agilent Technologies
ICP/MS, Laser ablation
Instrumentation
ICP/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Forensics

Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ

Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Routine determination of trace rare earth elements in high purity Nd2 O3 using the Agilent 8800 ICP-QQQ

Applications
| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Analysis of Shellfish Tissue for Cadmium, Mercury and Nickel

Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture

Validation of quantitative method for determination of elemental impurities in pharmaceutical products following USP 232/233 on ICPMS-2030

Applications
| 2019 | Shimadzu
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Shimadzu
Industries
Pharma & Biopharma

Analysis of Plants – 2

Applications
| N/A | Shimadzu
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Shimadzu
Industries
Food & Agriculture

Analysis of Heavy Metals in Baby FoodUsing ICP-MS

Applications
| 2025 | Shimadzu
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Shimadzu
Industries
Food & Agriculture

Particle Size Analysis of Polystyrene Microplastics by Single Particle (sp) ICP-MS

Applications
| 2022 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Determination of metals in soil by microwave plasma - atomic emission spectrometry (MP-AES) using DTPA extraction

Applications
| 2013 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Environmental

X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)

Applications
| N/A | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Other projects
GCMS
LCMS
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