Applications - page 14

Agilent ICP Expert Software

Technical notes
| 2022 | Agilent Technologies
Software, ICP-OES
Instrumentation
Software, ICP-OES
Manufacturer
Agilent Technologies, Elemental Scientific
Industries

Characterization of nanoparticles in aqueous samples by ICP-MS

Technical notes
| 2017 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals

Raman Spectroscopy as a Tool for Process Analytical Technology

Technical notes
| 2017 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Energy & Chemicals , Pharma & Biopharma

Advanced Near IR Algorithm Compensates for Spectral Features Related to Changes in Sampling Vials

Technical notes
| 2008 | Thermo Fisher Scientific
NIR Spectroscopy, Software
Instrumentation
NIR Spectroscopy, Software
Manufacturer
Thermo Fisher Scientific
Industries
Other

Five Benefits of a Cloud ELN

Technical notes
| 2018 | PerkinElmer
Software
Instrumentation
Software
Manufacturer
PerkinElmer
Industries

Fluorescent macromolecules and nanoparticles: characterization of molar mass, size and charge

Technical notes
| N/A | Wyatt Technology (Waters)
GPC/SEC
Instrumentation
GPC/SEC
Manufacturer
Waters
Industries
Energy & Chemicals

A Closer Look at Cannabis Testing

Technical notes
| 2017 | Shimadzu
GC/MSD, GC/MS/MS, GC/QQQ, HPLC, LC/MS, LC/MS/MS, LC/QQQ, ICP/MS, ICP-OES, AAS
Instrumentation
GC/MSD, GC/MS/MS, GC/QQQ, HPLC, LC/MS, LC/MS/MS, LC/QQQ, ICP/MS, ICP-OES, AAS
Manufacturer
Shimadzu
Industries
Food & Agriculture

Performance Attributes of the Agilent 8700 Laser Direct Infrared (LDIR) Chemical Imaging System

Technical notes
| 2022 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Environmental

Optimizing GFAAS Ashing and Atomizing Temperatures using Surface Response Methodology

Technical notes
| 2018 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries

Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS

Technical notes
| 1995 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Other projects
GCMS
LCMS
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