ICPMS
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Using ICP-MS/MS with M-Lens for the analysis of high silicon matrix samples

Posters
| 2020 | Agilent Technologies (ASMS)
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Analysis of Ultratrace Impurities in High Purity Copper using the Agilent 8900 ICP-QQQ

Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis

Optimization of method conditions for high matrix samples using the Agilent 4210 MP‑AES

Technical notes
| 2016 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries

Determination of Trace Impurities in High-Purity Copper by Sequential ICP-OES with Axial Viewing

Applications
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals

High-Speed Measurement of Microplastics Smaller than 100 μm Collected on a Filter and Efficient Analysis

Applications
| 2025 | Shimadzu
FTIR Spectroscopy, Particle size analysis
Instrumentation
FTIR Spectroscopy, Particle size analysis
Manufacturer
Shimadzu
Industries
Materials Testing, Environmental

Simple, Reliable Analysis of High Matrix Samples According to US EPA Method 6020A ICP-MS

Applications
| 2021 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental

High Efficiency in Multi-Sample Analysis by Automatic Analysis System of LabSolutions™ UV-Vis

Applications
| 2020 | Shimadzu
Sample Preparation, UV–VIS spectrophotometry
Instrumentation
Sample Preparation, UV–VIS spectrophotometry
Manufacturer
Shimadzu, Teledyne LABS
Industries

Bulk Analysis of Low Alloy, Cr-Mo, Free Machining, and Austenitic High Mn Steels

Applications
| 2019 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals

Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ

Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Ultra-low sulfur in automotive fuels according to ASTM D2622 with high power WDXRF spectrometer

Applications
| 2018 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals
Other projects
GCMS
LCMS
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike