Determination of Chromium, Selenium, and Molybdenum in Nutritional Products by ICP-MS

Applications
| 2015 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

Applications
| 2015 | Agilent Technologies
GC, Speciation analysis, ICP/MS/MS
Instrumentation
GC, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis

Safety - Carbon dioxide

Technical notes
| 2014 | Air Products
Consumables
Instrumentation
Consumables
Manufacturer
Air Products
Industries

NMR picoSpin Site and Safety Information

Manuals
| 2013 | Thermo Fisher Scientific
NMR
Instrumentation
NMR
Manufacturer
Thermo Fisher Scientific
Industries

OneNeb Nebulizer From Agilent

Applications
| 2012 | Agilent Technologies
ICP-OES, GD/MP/ICP-AES
Instrumentation
ICP-OES, GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries

Analysis of silicon, phosphorus and sulfur in 20% methanol using the Agilent 8800 Triple Quadrupole ICP-MS

Applications
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis

Determination of Wear Metals in Lubricating Oil on The Liberty Series II ICP-OES With the Axially-Viewed Plasma

Applications
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals

Determination of V, Ni, and Fe in Crude Oils and Bitumen using Sequential ICP-OES and Scandium as an Internal Standard

Applications
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals

Solutions for Children’s Product Testing

Technical notes
| 2010 | Agilent Technologies
GC/MSD, GC/IT, ICP-OES
Instrumentation
GC/MSD, GC/IT, ICP-OES
Manufacturer
Agilent Technologies
Industries
Materials Testing

Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples

Technical notes
| 2010 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
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