ICPMS
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Sensitive determination of elements in lithium batteries using the Thermo Scientific iCAP PRO XP ICP-OES

Applications
| 2020 | Thermo Fisher Scientific
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals

Determination of ultratrace elements in photoresist solvents using the Thermo Scientific iCAP TQs ICP-MS

Applications
| 2018 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific, Elemental Scientific, Teledyne LABS
Industries
Semiconductor Analysis

Noise Pollution in the Laboratory

Technical notes
| 2013 | Parker Hannifin
Instrumentation
Manufacturer
Industries

High-Throughput Analysis of Additive- Elements and Wear Metals in Lubricants by ICP-OES

Applications
| 2024 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals

Determination of V, Ni, and Fe in Crude Oils and Bitumen using Sequential ICP-OES and Scandium as an Internal Standard

Applications
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals

ICP Mass Spectrometer ICPMS-2040/2050 Series

Brochures and specifications
| 2025 | Shimadzu
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Shimadzu
Industries

Agilent 8800 Triple Quadrupole ICP-MS

Brochures and specifications
| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries

Routine determination of ultratrace elements in semiconductor grade nitric acid by the Thermo Scientific iCAP RQ ICP-MS

Applications
| 2017 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis

Determination of elemental nutrients in DTPA extracted soil using the Agilent 5110 SVDV ICP-OES

Applications
| 2016 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Food & Agriculture

Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
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More information
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike