ICPMS
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High precision copper and zinc isotopes with Neoma MS/MS MC-ICP-MS

Applications
| 2023 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Environmental

Determination of Trace Metal Impurities in High Purity Aluminum Nitrate using ICP-OES

Applications
| 2023 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals

High-Throughput, Multi-Element Analysis of Milk and Milk Powder Using ICP-MS

Applications
| 2021 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture

High Throughput Water Analysis using Agilent 7900 ICP-MS coupled with ESI prepFAST

Applications
| 2017 | Agilent Technologies
Sample Preparation, ICP/MS
Instrumentation
Sample Preparation, ICP/MS
Manufacturer
Agilent Technologies, Elemental Scientific
Industries
Environmental

Analysis of Trace Metal Impurities in High Purity Hydrochloric Acid Using ICP-QQQ

Applications
| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Determination of High Concentration Sodium by Flame Atomic Absorption Spectrophotometry (FAAS) at Different Wavelengths

Applications
| 2016 | Shimadzu
AAS
Instrumentation
AAS
Manufacturer
Shimadzu
Industries
Pharma & Biopharma

High throughput determination of inorganic arsenic in rice using hydride generation-ICP-MS

Applications
| 2015 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture

Bulk Flow X-ray Inspection: Providing Protection for High-Value, Unpackaged Food Production

Others
| 2015 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Food & Agriculture

Rapid Analysis of High-Matrix Environmental Samples Using the Agilent 7500cx ICP-MS

Technical notes
| 2007 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike