Library - page 110 | LabRulez ICPMS

Workflow Breakthroughs That are Improving Data Quality and Efficiency

Others

| 2020 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Pharma & Biopharma

Robust analysis of REE in electronic waste

Applications

| 2020 | Thermo Fisher Scientific

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Thermo Fisher Scientific, Elemental Scientific

Industries

Materials Testing

UV/Vis Pharmacopeia Performance Verification on Lunatic & Stunner

Technical notes

| 2020 | Unchained Labs

Particle characterization, UV–VIS spectrophotometry

Instrumentation

Particle characterization, UV–VIS spectrophotometry

Manufacturer

Unchained Labs

Industries

Pharma & Biopharma

Analysis of solar cell silicon

Applications

| 2019 | Thermo Fisher Scientific

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

BRAVO handheld Raman spectrometer

Brochures and specifications

| 2018 | Bruker Optics

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Bruker

Industries

Materials Testing

The Migration of Elements from Toys and Speciation of Chromium (VI) in Toy Material Using a Low Cost IC-ICP-MS Solution

Applications

| 2016 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Analysis of inorganic impurities in lubricating oils by ICP-MS

Applications

| 2013 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

Analysis of Environmental Samples Following US EPA Guidelines Utilizing a New Simultaneous CCD Detector ICP-OES System

Posters

| 2006 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Environmental

RoHS/ELV Directives - Measurement of Heavy Metals Using ICP-MS

Applications

| 2006 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications

| 2001 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis