Menu
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike
Routine determination of trace rare earth elements in high purity Nd2 O3 using the Agilent 8800 ICP-QQQ
Applications
| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Rapid Analysis of High-Matrix Environmental Samples Using the Agilent 7500cx ICP-MS
Technical notes
| 2007 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Comparison of manual versus automated protein formulation development workflow on a Big Kahuna
Applications
| 2018 | Unchained Labs
Sample Preparation, UV–VIS spectrophotometry
Instrumentation
Sample Preparation, UV–VIS spectrophotometry
Manufacturer
Unchained Labs
Industries
Proteomics
Determination of trace heavy metals in spices using single quadrupole ICP-MS
Applications
| 2020 | Thermo Fisher Scientific
ICP/MS, Sample Preparation
Instrumentation
ICP/MS, Sample Preparation
Manufacturer
Thermo Fisher Scientific, Teledyne LABS, CEM
Industries
Food & Agriculture
Determination of iodine-containing species in seaweed using IC-ICP-MS
Applications
| 2020 | Thermo Fisher Scientific
IC-MS, IC/MS/MS, ICP/MS, ICP/MS/MS, Speciation analysis
Instrumentation
IC-MS, IC/MS/MS, ICP/MS, ICP/MS/MS, Speciation analysis
Manufacturer
Thermo Fisher Scientific
Industries
Environmental
The accurate measurement of selenium in twelve diverse reference materials using on-line isotope dilution with the 8800 Triple Quadrupole ICP-MS in MS/MS mode
Applications
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Ensuring Regulatory Compliance and Data Integrity with MassHunter Software Solutions
Technical notes
| 2021 | Agilent Technologies
Software
Instrumentation
Software
Manufacturer
Agilent Technologies
Industries
Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS
Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
Follow us
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike