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Multi-technique composition, coverage and band gap analysis of ALD-grown ultra thin films
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| 2020 | Thermo Fisher Scientific
X-ray
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X-ray
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Thermo Fisher Scientific
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Materials Testing
Multi-technique surface analysis for structural and chemical characterization of 2D materials
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| 2020 | Thermo Fisher Scientific
X-ray
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X-ray
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Thermo Fisher Scientific
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Materials Testing
Simple Steps for Clearing a Blocked Injector in Your ICP-OES Torch
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| 2018 | Agilent Technologies
ICP-OES
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ICP-OES
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Agilent Technologies
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Precision Analysis of Toxic Elements in Plastic by ICPE-9800 Series
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| 2014 | Shimadzu
GD/MP/ICP-AES
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GD/MP/ICP-AES
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Shimadzu
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Materials Testing
Quantitative Depth Profile (QDP) Analysis of Carburized Steel
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| 2007 | LECO
GD/MP/ICP-AES, Elemental Analysis
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GD/MP/ICP-AES, Elemental Analysis
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LECO
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WCPS: Direct determination of Al, B, Co, Cr, Mo, Ti, V and Zr in HF acid-digested nickel alloy using the Agilent 4210 MP-AES
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| 2017 | Agilent Technologies
GD/MP/ICP-AES
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GD/MP/ICP-AES
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Agilent Technologies
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Agilent ICP-MS Journal (May 2015 – Issue 61)
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| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Agilent ICP-MS Journal (November 2011 – Issue 48)
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| 2011 | Agilent Technologies
ICP/MS, GD/MP/ICP-AES
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ICP/MS, GD/MP/ICP-AES
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Agilent Technologies
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Energy & Chemicals
Understanding Calibration for Glow Discharge Atomic Emission Spectrometry (GD-AES)
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| 2011 | LECO
GD/MP/ICP-AES, Elemental Analysis
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GD/MP/ICP-AES, Elemental Analysis
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LECO
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Materials Testing, Energy & Chemicals
Direct determination of Cu, Fe, Mn, P, Pb and Ti in HF acid-digested soils using the Agilent 4200 Microwave Plasma- Atomic Emission Spectrometer
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| 2015 | Agilent Technologies
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