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Errors Associated With Thin Film Measurements Using XPS at a Single Angle
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Characterization of High-k Dielectric Materials on Silicon Using Angle Resolved XPS
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Method for Charge Compensation on Sigma Probe, Theta Probe and Theta 300
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Characterization of Silicon Oxide and Oxynitride Layers
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
High Resolution XPS Mapping
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Theta Probe: Small Spot XPS Spectrometer with Parallel ARXPS Capability
Brochures and specifications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Unattended Analysis of Multiple Insulating Samples
Applications
| 2008 | Thermo Fisher Scientific
X-ray, Software
Instrumentation
X-ray, Software
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
K-Alpha: Accurate Feature Alignment with Unique Reflex Optics
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike