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Applications - page 47
Characterization of Silicon Oxide and Oxynitride Layers
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| 2008 | Thermo Fisher Scientific
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Thermo Fisher Scientific
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Materials Testing
High Resolution XPS Mapping
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| 2008 | Thermo Fisher Scientific
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Thermo Fisher Scientific
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Parallel Angle-resolved XPS Analysis of a Self Assembled Monolayer with the Theta Probe
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| 2008 | Thermo Fisher Scientific
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The Karlsruhe Micro Nose, KAMINA
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| 2008 | Thermo Fisher Scientific
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Unattended Analysis of Multiple Insulating Samples
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| 2008 | Thermo Fisher Scientific
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Characterization of Chemical Gradients and Antibody Immobilization Using XPS and ARXPS
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| 2008 | Thermo Fisher Scientific
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Thermo Fisher Scientific
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K-Alpha: Accurate Feature Alignment with Unique Reflex Optics
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| 2008 | Thermo Fisher Scientific
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Thermo Fisher Scientific
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K-Alpha: A New Concept in XPS
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| 2008 | Thermo Fisher Scientific
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Thermo Fisher Scientific
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K-Alpha: Investigating the Mechanism of Defect Formation on Aging Paper
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| 2008 | Thermo Fisher Scientific
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Thermo Fisher Scientific
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K-Alpha: Energy Scale Linearity and Calibration
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| 2008 | Thermo Fisher Scientific
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Thermo Fisher Scientific
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