Library | LabRulez ICPMS

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications

| 2001 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

General Features of the New Agilent 7500 ICP-MS

Brochures and specifications

| 2000 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Excellent choices for environmental applications - Water

Guides

| 2009 | Agilent Technologies

GC, GC/MSD, HeadSpace, SPME, Purge and Trap, Sample Preparation, GC/SQ, GC columns, Consumables, Software, HPLC, Ion chromatography, LC/TOF, LC/MS, LC/MS/MS, LC/QQQ, LC/SQ, Capillary electrophoresis, LC/IT, ICP/MS, Speciation analysis, Laser ablation

Instrumentation

GC, GC/MSD, HeadSpace, SPME, Purge and Trap, Sample Preparation, GC/SQ, GC columns, Consumables, Software, HPLC, Ion chromatography, LC/TOF, LC/MS, LC/MS/MS, LC/QQQ, LC/SQ, Capillary electrophoresis, LC/IT, ICP/MS, Speciation analysis, Laser ablation

Manufacturer

Agilent Technologies, Metrohm

Industries

Environmental, Food & Agriculture

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

General Features of the New Agilent 7500 ICP-MS

Excellent choices for environmental applications - Water

Related content

TRIO OF UTA CHEMISTS RECOGNIZED AS LEADING LIGHTS

“Fat can be extracted even from thousand-year-old pottery,” says V. Brychová

IOCB Prague opens branch in Boston, USA, prepares to make progress in cancer research