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    Analysis of Radix Bupleuri (Chaihu) using Agilent 1200 Series LC Systems with Evaporative Light Scattering Detector

    Applications
    | 2008 | Agilent Technologies
    HPLC
    Instrumentation
    HPLC
    Manufacturer
    Agilent Technologies
    Industries
    Pharma & Biopharma

    Diffuse Reflectance Accessories (DRAs)

    Brochures and specifications
    | 2021 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries

    Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

    Applications
    | 2011 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    Measuring the Optical Properties of Photovoltaic Cells

    Applications
    | 2023 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Agilent MassHunter Molecular Structure Correlator (MSC) Software - Quick Start Guide

    Manuals
    | 2014 | Agilent Technologies
    Software
    Instrumentation
    Software
    Manufacturer
    Agilent Technologies
    Industries

    Agilent MassHunter Molecular Structure Correlator (MSC) Software

    Manuals
    | 2014 | Agilent Technologies
    Software
    Instrumentation
    Software
    Manufacturer
    Agilent Technologies
    Industries

    Optical Characterization of Materials Using Spectroscopy

    Guides
    | 2023 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals , Materials Testing, Semiconductor Analysis
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