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Measurement of composite surface contamination using the Agilent 4100 ExoScan FTIR with diffuse reflectance sampling interface
Applications
| 2015 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
The Measurement of Silicon, Tin, and Titanium in Jet-Engine Oil
Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Ultratrace Analysis of Solar (Photovoltaic) Grade Bulk Silicon by ICP-MS
Applications
| 2008 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
The Determination of Sodium, Calcium and Silicon in Pure Water by Graphite Furnace AA
Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Environmental
Analysis of Ultratrace Impurities in High Silicon Matrix Samples by ICP-QQQ
Applications
| 2021 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Determination of silicon in diesel and biodiesel by Microwave Plasma-Atomic Emission Spectrometry
Applications
| 2012 | Agilent Technologies
MP/ICP-AES
Instrumentation
MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Using ICP-MS/MS with M-Lens for the analysis of high silicon matrix samples
Posters
| 2020 | Agilent Technologies (ASMS)
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS
Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike