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    Using ICP-MS/MS with M-Lens for the analysis of high silicon matrix samples

    Posters
    | 2020 | Agilent Technologies (ASMS)
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

    Applications
    | 2003 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Determination of Elemental Impurities in Silicon-Carbon Anode Materials for Lithium-Ion Batteries by ICP-OES

    Applications
    | 2023 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals , Materials Testing

    The Analysis of Cement

    Applications
    | 2010 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals

    Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

    Applications
    | 2001 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Analysis of silicon, phosphorus and sulfur in 20% methanol using the Agilent 8800 Triple Quadrupole ICP-MS

    Applications
    | 2012 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals , Semiconductor Analysis

    Quantification of Release Agent on a Carbon-Fiber-Reinforced Polymer using a Hand-Held FTIR

    Applications
    | 2018 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Quantitative characterization of silica nanoparticles by asymmetric flow FFF‑MALS‑ICP‑QQQ using the Agilent 8800 ICP‑QQQ

    Applications
    | 2016 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental, Food & Agriculture, Materials Testing

    Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS

    Applications
    | 2013 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Trace Elemental Analysis of Trichlorosilane by Agilent ICP-MS

    Applications
    | 2021 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis
     

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