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Publication Date
High Volume Optical Component Testing
Applications
| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
ICP Expert 21 CFR 11 Software SCM Patch Instructions
Manuals
| 2016 | Agilent Technologies
Software, ICP/OES
Instrumentation
Software, ICP/OES
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Agilent Technologies
Industries
Agilent ICP-MS Journal (Issue 12, April 2002)
Others
| 2002 | Agilent Technologies
GC, ICP/MS, Speciation analysis
Instrumentation
GC, ICP/MS, Speciation analysis
Manufacturer
Agilent Technologies
Industries
Environmental
Spectrophotometric Spatial Profiling of Coated Optical Wafers
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| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
Industries
Materials Testing
Agilent Cary Universal Measurement Accessory (UMA)
Technical notes
| 2013 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Rapid, Large-Area, On-Filter Analysis of Microplastics from Plastic Bottles Using Laser Direct Infrared Imaging
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| 2022 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Environmental
Agilent Cary UV Workstation Version 1.3 Software Status Bulletin
Manuals
| 2022 | Agilent Technologies
Software, UV–VIS spectrophotometry
Instrumentation
Software, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
A Faster, More Accurate Way of Characterizing Cube Beamsplitters
Applications
| 2022 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
A Faster, More Accurate Way of Characterizing Cube Beamsplitters
Applications
| 2022 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
Applications
| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
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