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A Faster, More Accurate Way of Characterizing Cube Beamsplitters
Applications
| 2022 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
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NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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Materials Testing
A Faster, More Accurate Way of Characterizing Cube Beamsplitters
Applications
| 2022 | Agilent Technologies
UV–VIS spectrophotometry
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UV–VIS spectrophotometry
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Agilent Technologies
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Materials Testing
Make cone inspection more reliable and less of a chore
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| 2018 | Agilent Technologies
Consumables
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Agilent Technologies
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Are you measuring ICP-OES samples more than once?
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| 2019 | Agilent Technologies
ICP/OES
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ICP/OES
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Agilent Technologies
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RESEARCHER USES AGILENT INSTRUMENTS TO CREATE MORE EFFECTIVE ANALYTICAL METHODS
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| 2016 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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ORS4 AND HELIUM MODE FOR MORE EFFECTIVE INTERFERENCE REMOVAL IN COMPLEX SAMPLES
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| 2015 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
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Faster, Simpler, More Accurate Semiquantitative Analysis Using the Agilent 7500cx ICP-MS
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| 2007 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
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Agilent 5900 ICP-OES
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| 2022 | Agilent Technologies
ICP/OES
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ICP/OES
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Agilent Technologies
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How to optimize your ICP-OES methods
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| 2017 | Agilent Technologies
ICP/OES
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ICP/OES
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Agilent Technologies
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Why Calibration Graphs Curve in Atomic Absorption Spectrometry
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| 2010 | Agilent Technologies
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AAS
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Agilent Technologies
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