Library | LabRulez ICPMS | LabRulez ICPMS

Comparison of the Sensitivity of Static Headspace GC, Solid Phase Microextraction, and Direct Ther mal Extraction for Analysis of Volatiles in Solid Matrices

Applications

| 2000 | GERSTEL

GC/MSD, HeadSpace, SPME, Thermal desorption, GC/SQ

Instrumentation

GC/MSD, HeadSpace, SPME, Thermal desorption, GC/SQ

Manufacturer

Agilent Technologies, GERSTEL

Industries

Environmental

Lower Detection Limits and Quantitate with Confidence with Breakthrough Ultra Inert Technology

Presentations

| 2011 | Agilent Technologies

GC, GC/MSD, Consumables

Instrumentation

GC, GC/MSD, Consumables

Manufacturer

Agilent Technologies

Industries

Achieving Lower Detection Limits Easily with the Agilent Multimode Inlet (MMI)

Technical notes

| 2009 | Agilent Technologies

GC, GC/MSD

Instrumentation

GC, GC/MSD

Manufacturer

Agilent Technologies

Industries

C1 – C3 Hydrocarbon Analysis Using the Agilent 490 Micro GC – Separation Characteristics for PoraPLOT U and PoraPLOT Q Column Channels

Applications

| 2012 | Agilent Technologies

GC, GC columns, Consumables

Instrumentation

GC, GC columns, Consumables

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

EPA Method 541 UCMR4 Standard at Method Reporting Limit on Stabilwax (SIM)

Applications

| 2017 | Restek

GC/MSD, GC/SQ, GC columns, Consumables

Instrumentation

GC/MSD, GC/SQ, GC columns, Consumables

Manufacturer

Agilent Technologies, Restek

Industries

Environmental

Optimizing GC/MS Performance for Lowest Detection Limits and Widest Linear Range

Posters

| 2013 | Agilent Technologies

GC/MSD, GC/MS/MS, GC/SQ, GC/QQQ

Instrumentation

GC/MSD, GC/MS/MS, GC/SQ, GC/QQQ

Manufacturer

Agilent Technologies

Industries

EPA Method 530 UCMR4 Standard at Method Reporting Limit on Rtx-1701 (SIM)

Applications

| 2017 | Restek

GC/MSD, GC/SQ, GC columns, Consumables

Instrumentation

GC/MSD, GC/SQ, GC columns, Consumables

Manufacturer

Agilent Technologies, Restek

Industries

Environmental

EPA Method 541 UCMR4 Standard at 10x the Method Reporting Limit on Stabilwax (SIM)

Applications

| 2017 | Restek

GC/MSD, GC/SQ, GC columns, Consumables

Instrumentation

GC/MSD, GC/SQ, GC columns, Consumables

Manufacturer

Agilent Technologies, Restek

Industries

Environmental

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

Applications

| 2015 | Agilent Technologies

GC, Speciation analysis, ICP/MS/MS

Instrumentation

GC, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

Femtogram GC/MSD Detection Limits for Environmental Semivolatiles Using a Triple-Axis Detector

Applications

| 2008 | Agilent Technologies

GC/MSD, GC/SQ

Instrumentation

GC/MSD, GC/SQ

Manufacturer

Agilent Technologies

Industries

Environmental